- induced current image
- 感生电流象
English-Chinese electricity dictionary (电气专业词典). 2013.
induced current image
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Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
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Charge Induced Voltage Alteration — (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis.Theory of operationThe scanning of an electron beam across the surface … Wikipedia
Charge induced voltage alteration — (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis. Theory of operation The scanning of an electron beam across the… … Wikipedia
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Light induced voltage alteration — (LIVA) is a semiconductor analysis technique that uses a laser or infrared light source to induce voltage changes in a device while scanning the beam of light across its surface. The technique relies upon the generation of electron hole pairs in… … Wikipedia
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Magnetometer — A magnetometer is a measuring instrument used to measure the strength or direction of a magnetic field either produced in the laboratory or existing in nature. Some countries such as the USA, Canada and Australia classify the more sensitive… … Wikipedia
Microscopie électronique à balayage — Pour les articles homonymes, voir MEB, SEM, Microscope (homonymie) et Microscopie. Microscope électronique à balayage JEOL JSM 6340F La microscopie éle … Wikipédia en Français
Earth Sciences — ▪ 2009 Introduction Geology and Geochemistry The theme of the 33rd International Geological Congress, which was held in Norway in August 2008, was “Earth System Science: Foundation for Sustainable Development.” It was attended by nearly… … Universalium
